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- 2023
-
Mark
Secure reuse of DfT during operation
2023) Nordic Test Forum(
- Contribution to conference › Paper, not in proceeding
-
Mark
Co-optimization of security and accessibility to on-chip instruments
2023) 24th IEEE Latin-American Test Symposium, LATS 2023(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2022
-
Mark
Reusing IEEE 1687-Compatible Instruments and Sub-Networks over a System Bus
2022) p.219-228(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Graceful degradation to prolong lifetime of semiconductors
2022) Knowledge for Sustainable Development(
– Lund University Research Conference- Contribution to conference › Poster
- 2021
-
Mark
System-Level Access to On-Chip Instruments
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Graceful Degradation of Reconfigurable Scan Networks
(
- Contribution to journal › Scientific review
-
Mark
Access to on-chip test structures via functional buses
2021) Nordic Test Forum(
- Contribution to conference › Other
-
Mark
Accessing general IEEE Std. 1687 networks via functional ports
2021) p.354-363(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2020
-
Mark
IEEE Std. P1687.1 for Access Control of Reconfigurable Scan Networks
2020) 25th IEEE European Test Symposium (ETS), 2020(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2019
-
Mark
IEEE Std. P1687.1: translator and protocol
2019) International Test Conference (ITC)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding