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2016
Mark Electrical Characterization and Modeling of Gate-Last Vertical InAs Nanowire MOSFETs on Si
Berg, Martin ^LU ; Kilpi, Olli-Pekka ^LU ; Persson, Karl-Magnus ^LU ; Svensson, Johannes ^LU ; Hellenbrand, Markus ^LU ; Lind, Erik ^LU and Wernersson, Lars-Erik ^LU (2016) In IEEE Electron Device Letters 37(8). p.966-969
- Contribution to journal › Letter
Mark Self-aligned, gate-last process for vertical InAs nanowire MOSFETs on Si
Berg, Martin ^LU ; Persson, Karl-Magnus ^LU ; Kilpi, Olli-Pekka ^LU ; Svensson, Johannes ^LU ; Lind, Erik ^LU and Wernersson, Lars-Erik ^LU (2016) 61st IEEE International Electron Devices Meeting, IEDM 2015 2016-February.
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding

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