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- 2025
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Mark
Large Language Models for Printed Circuit Board Test Generation
2025) 26th IEEE Latin-American Test Symposium (LATS2025)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Low-frequency noise in ferroelectric III-V vertical gate-all-around FETs
2025) In IEEE Electron Device Letters(
- Contribution to journal › Article
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Interface Characterization of Plasma-Treated InAs Electrodes for Resistive Random-Access Memories Using Capacitance–Voltage Methods
2025) In Physica Status Solidi (A) Applications and Materials Science(
- Contribution to journal › Article
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Mark
Binary Forward-Only Algorithms
2025) In IEEE Design and Test(
- Contribution to journal › Article
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Mark
Demystifying AMD SEV Performance Penalty for NFV Deployment
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Degrees of Freedom for Radiating Systems
(
- Contribution to journal › Article
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OT-PCA: New Key-Recovery Plaintext-Checking Oracle Based Side-Channel Attacks on HQC with Offline Templates
(
- Contribution to journal › Article
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A Reconfigurable Ferroelectric Transistor as An Ultra-Scaled Cell for Low-Power In-Memory Data Processing
(
- Contribution to journal › Article
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Revisiting Leakage-Resilient MACs and Succinctly-Committing AEAD : More Applications of Pseudo-Random Injections
(
- Working paper/Preprint › Preprint in preprint archive
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Mark
A Trust Establishment and Key Management Architecture for Hospital-at-Home
(
- Contribution to journal › Article