191 – 200 of 5499
- show: 10
- |
- sort: year (new to old)
Close
Embed this list
<iframe src=" "
width=" "
height=" "
allowtransparency="true"
frameborder="0">
</iframe>
- 2023
-
Mark
PrSLoc : Sybil attack detection for localization with private observers using differential privacy
(
- Contribution to journal › Article
-
Mark
High-Resolution Channel Sounding and Parameter Estimation in Multi-Site Cellular Networks
2023) European Conference on Networks and Communications (EuCNC) and 6G Summit(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Extended FastSLAM Using Cellular Multipath Component Delays and Angular Information
2023) IEEE 97th Vehicular Technology Conference, VTC 2023 Spring(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Propagation Modeling for Physically Large Arrays: Measurements and Multipath Component Visibility
2023) European Conference on Networks and Communications (EuCNC) and 6G Summit(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Broadband RF Front-End Featuring a Reconfigurable Q-Enhanced Filter for Upper Mid-Band 6G Receivers
2023) p.1-5(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
A Safe and Robust Autonomous Intersection Management System Using a Hierarchical Control Strategy and V2I Communication
(
- Contribution to journal › Article
-
Mark
Flexible Density-based Multipath Component Clustering Utilizing Ground Truth Pose
2023) IEEE 98th Vehicular Technology Conference (VTC2023-Fall)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Low-Density Parity-Check Codes and Spatial Coupling for Quantitative Group Testing
2023) 2023 International Symposium on Information Theory(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Radio Frequency InGaAs MOSFETs
2023)(
- Thesis › Doctoral thesis (compilation)
-
Mark
Geometric control of diffusing elements on InAs semiconductor surfaces via metal contacts
(
- Contribution to journal › Article