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2020
Mark A 19.5-GHz 28-nm Class-C CMOS VCO, with a reasonably rigorous result on 1/f noise upconversion caused by short-channel effects
Franceschin, Alessandro ; Andreani, Pietro ^LU ; Padovan, Fabio ; Bassi, Matteo and Bevilacqua, Andrea (2020) In IEEE Journal of Solid-State Circuits 55(7). p.1842-1853
- Contribution to journal › Article
2019
Mark A 19.5 GHz 28 nm CMOS Class-C VCO with Reduced 1/f Noise Upconversion
Franceschin, Alessandro ; Andreani, Pietro ^LU ; Padovan, Fabio ; Bassi, Matteo ; Nonis, Roberto and Bevilacqua, Andrea (2019) 45th IEEE European Solid State Circuits Conference, ESSCIRC 2019 p.45-48
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2017
Mark 1/f and RTS noise in InGaAs nanowire MOSFETs
Möhle, C. ; Zota, C. B. ^LU ; Hellenbrand, M. ^LU and Lind, E. ^LU (2017) Conference on Insulating Films on Semiconductors (INFOS) In Microelectronic Engineering 178. p.52-55
- Contribution to journal › Article
Mark 1/f and RTS Noise in InGaAs Nanowire MOSFETs
Möhle, Christian ; Zota, Cezar ^LU ; Hellenbrand, Markus ^LU and Lind, Erik ^LU (2017) Conference on Insulating Films on Semiconductors (INFOS)
- Contribution to conference › Paper, not in proceeding
2012
Mark An Analysis of 1/f Noise to Phase Noise Conversion in CMOS Harmonic Oscillators
Bevilacqua, Andrea and Andreani, Pietro ^LU (2012) In IEEE Transactions on Circuits and Systems Part 1: Regular Papers 59(5). p.938-945
- Contribution to journal › Article

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