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- 2017
-
Mark
Two Countermeasures Against Hardware Trojans Exploiting Non-Zero Aliasing Probability of BIST
(
- Contribution to journal › Article
- 2014
-
Mark
Robustness of TAP-based Scan Networks
2014) IEEE International Test Conference, 2014(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Keyed logic BIST for Trojan detection in SoC
2014) 2014 16th International Symposium on System-on-Chip, SoC 2014 In 2014 International Symposium on System-on-Chip, SoC 2014(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Fault injection and fault handling: an MPSoC demonstrator using IEEE P1687
2014) 20th IEEE International On-Line Testing Symposium(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2013
-
Mark
Scenario-Based Network Design for P1687
2013) Swedish System-On-Chip Conference (SSoCC), 2013(
- Contribution to conference › Paper, not in proceeding
- 2012
-
Mark
Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687
(
- Contribution to journal › Article
-
Mark
Access Time Analysis for IEEE P1687
(
- Contribution to journal › Article
-
Mark
An MPSoCs demonstrator for fault injection and fault handling in an IEEE P1687 environment
2012) IEEE European Test Symposium (ETS), 2012(
- Contribution to conference › Paper, not in proceeding
- 2011
-
Mark
SoC-Level Fault Management based on P1687 IJTAG
2011)(
- Other contribution › Miscellaneous
-
Mark
Design Automation for IEEE P1687
2011) Design, Automation and Test in Europe (DATE 2011),(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
A Study of Instrument Reuse and Retargeting in P1687
2011) IEEE Twelfth Workshop on RTL and High Level Testing (WRTLT 2011)(
- Contribution to conference › Paper, not in proceeding
-
Mark
Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2010
-
Mark
Test Time Analysis for IEEE P1687
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Test scheduling on IJTAG
2010) Nordic Test Forum (NTF 2010),(
- Contribution to conference › Paper, not in proceeding
-
Mark
Efficient Embedding of Deterministic Test Data
2010) 19th IEEE Asian Test Symposium (ATS10)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Efficient Embedding of Deterministic Test Data
2010) Swedish SoC Conference 2010(
- Contribution to conference › Paper, not in proceeding
- 2007
-
Mark
Protocol Requirements in an SJTAG/IJTAG Environment
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Extended STAPL as SJTAG Engine
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Protocol Requirements in an SJTAG/IJTAG Environment
2007) Nordic Test Forum NTF,2007(
- Contribution to conference › Paper, not in proceeding
- 2005
-
Mark
Remote Boundary-Scan System Test Control for the ATCA Standard
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Boundary-Scan Test Control in the ATCA Standard
2005)(
- Contribution to conference › Paper, not in proceeding
- 2001
-
Mark
The Design and Optimization of SOC Test Solutions
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 1936
-
Mark
Eine Denkschrift an Caesar über den Staat : historisch-philologisch Untersucht
(
- Book/Report › Book