LTH School of Engineering in Helsingborg
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- 2023
-
Mark
Co-optimization of security and accessibility to on-chip instruments
2023) 24th IEEE Latin-American Test Symposium, LATS 2023(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
A data-driven approach for understanding invalid bug reports: An industrial case study
(
- Contribution to journal › Article
- 2022
-
Mark
Exploring ML testing in practice - Lessons learned from an interactive rapid review with Axis Communications
2022) 2022 IEEE/ACM 1st International Conference on AI Engineering – Software Engineering for AI (CAIN)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Graceful degradation to prolong lifetime of semiconductors
2022) Knowledge for Sustainable Development(
– Lund University Research Conference- Contribution to conference › Poster
-
Mark
Reusing IEEE 1687-Compatible Instruments and Sub-Networks over a System Bus
2022) p.219-228(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2021
-
Mark
System-Level Access to On-Chip Instruments
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Graceful Degradation of Reconfigurable Scan Networks
(
- Contribution to journal › Scientific review
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Mark
Access to on-chip test structures via functional buses
2021) Nordic Test Forum(
- Contribution to conference › Other
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Mark
Användning av CEQ:s TM-skala för projektbaserade kurser
2021) LTH:s 11:e pedagogiska inspirationskonferens, 2021 In Proceedings från LTH:s Pedagogiska inspirationskonferens p.9-12(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Accessing general IEEE Std. 1687 networks via functional ports
2021) p.354-363(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding