Erik Larsson

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2007
Mark Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
Larsson, Erik ^LU and Edbom, Stina (2007) p.221-244
- Chapter in Book/Report/Conference proceeding › Book chapter
Mark Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
Dubois, Tobias ; Marinissen, Erik Jan ; Azimane, Mohamed ; Wielage, Paul ; Larsson, Erik ^LU and Wouters, Clemens (2007) Design, Automation, and Test in Europe DATE p.859-859
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Improved Scan Chain Diagnosis
Marinissen, Erik Jan ; Adolfsson, Dan ; Larsson, Erik ^LU and Goel, Sandeep-Kumar (2007) 15th NXP IC Test Symposium
- Contribution to conference › Paper, not in proceeding
Mark Protocol Requirements in an SJTAG/IJTAG Environment
Larsson, Erik ^LU ; Carlsson, Gunnar and Holmqvist, Johan (2007) Nordic Test Forum NTF,2007
- Contribution to conference › Paper, not in proceeding
2006
Mark Cycle-Accurate Test Power Modeling and its Application to SoC Test Scheduling
Samii, Soheil ; Larsson, Erik ^LU ; Chakrabarty, Krishnendu and Peng, Zebo (2006) IEEE International Test Conference ITC '06 p.1-32
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Power-Aware Test Planning in the Early System-On-Chip Design Exploration Process
Larsson, Erik ^LU and Peng, Zebo (2006) In IEEE Transactions on Computers 55(2). p.227-239
- Contribution to journal › Article
Mark System-on-chip test scheduling with reconfigurable core wrappers
Larsson, Erik ^LU and Fujiwara, H (2006) In IEEE Transactions on Very Large Scale Integration (VLSI) Systems 14(3). p.305-309
- Contribution to journal › Article
Mark Combined Test Data Compression and Abort-on-Fail Test
Larsson, Erik ^LU (2006) NORCHIP Conference, 2006 p.137-140
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO
Dubois, Tobias ; Azimane, Mohamed ; Larsson, Erik ^LU ; Marinissen, Erik Jan ; Wielage, Paul and Wouters, Clemens (2006) 14th Philips Research IC Test Seminar
- Contribution to conference › Paper, not in proceeding
2005
Mark Abort-on-Fail Based Test Scheduling
Larsson, Erik ^LU ; Pouget, Julien and Peng, Zebo (2005) In Journal of Electronic Testing 21(6). p.651-658
- Contribution to journal › Article

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