Erik Larsson
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- 2019
-
Mark
Maintainability of large-scale IoT
- Contribution to conference › Paper, not in proceeding
-
Mark
Test Flow Selection for Stacked Integrated Circuits
SenGupta, Breeta LU ; Nikolov, Dimitar LU ; Dash, Assmitra and Larsson, Erik LU
(2019)
In Journal of Electronic Testing: Theory and Applications
35(4).
p.425-440
- Contribution to journal › Article
-
Mark
IEEE Std. P1687.1: Access to IEEE Std. 1687 via UART
Larsson, Erik LU
; Murali, Prathamesh
and Kumisbek, Gani
(2019)
4th International Test Standards Application Workshop
- Contribution to conference › Paper, not in proceeding
- 2018
-
Mark
Test of Reconfigurable Modules in Scan Networks
Cantoro, Riccardo ; Ghani Zadegan, Farrokh LU ; Palena, Marco ; Pasini, Paolo ; Larsson, Erik LU
and Sonza Reorda, Matteo
(2018)
In IEEE Transactions on Computers
67(12).
p.1806-1817
- Contribution to journal › Article
-
Mark
Systemkretsar ställer nya krav på testningen
- Contribution to specialist publication or newspaper › Newspaper article
-
Mark
On-Chip Fault Monitoring Using Self-Reconfiguring IEEE 1687 Networks
Ghani Zadegan, Farrokh LU ; Nikolov, Dimitar LU and Larsson, Erik LU
(2018)
In IEEE Transactions on Computers
67(2).
p.237-251
- Contribution to journal › Article
- 2017
-
Mark
BASTION: Board and SoC test instrumentation for ageing and no failure found
Jutman, Artur ; Lotz, Christophe ; Larsson, Erik LU
; Sonza Reorda, Matteo
; Jenihhin, Maksim
; Raik, Jaan
; Kerkhoff, Hans
; Krenz-Baath, Rene
and Engelke, Piet
(2017)
In Proceedings (Design, Automation, and Test in Europe Conference and Exhibition. Online)
p.115-120
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Fault Extraction in Self-Reconfiguring IEEE 1687 Networks
Ghani Zadegan, Farrokh LU ; Nikolov, Dimitar LU and Larsson, Erik LU
(2017)
2nd Test Standards Application Workshop
- Contribution to conference › Paper, not in proceeding
-
Mark
Reducing Pessimism in Upper-Bound Computation for Optimal IEEE 1687 Retargeting
Ghani Zadegan, Farrokh LU ; Krenz-Baath, Rene and Larsson, Erik LU
(2017)
2nd Test Standards Application Workshop
- Contribution to conference › Paper, not in proceeding
-
Mark
Test Planning for Core-based Integrated Circuits under Power Constraints
SenGupta, Breeta LU ; Nikolov, Dimitar LU ; Ingelsson, Urban and Larsson, Erik LU
(2017)
In Journal of Electronic Testing: Theory and Applications
33(1).
p.7-23
- Contribution to journal › Article