Erik Larsson
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- 2016
-
Mark
On the diagnostic analysis of IEEE 1687 networks
Cantoro, R. ; Montazeri, M. ; Reorda, M. Sonza ; Zadegan, F. Ghani LU and Larsson, E. LU
(2016)
21st IEEE European Test Symposium, ETS 2016
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Compressor design for silicon debug
Zhang, Jing ; Fritz, Lars Johan ; Liu, Liang LU
and Larsson, Erik
LU
(2016)
21st IEEE European Test Symposium, ETS 2016
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Upper-bound computation for optimal retargeting in IEEE1687 networks
Ghani Zadegan, Farrokh LU ; Krenz-Baath, Rene and Larsson, Erik LU
(2016)
2016 IEEE International Test Conference (ITC)
p.1-10
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2015
-
Mark
Abort-on-Fail Test Scheduling for Modular SOCs without and with Preemption
Ingelsson, Urban ; Kumar Goel, Sandeep ; Larsson, Erik LU
and Marinissen, Erik Jan
(2015)
In IEEE Transactions on Computers
64(12).
p.3335-3347
- Contribution to journal › Article
-
Mark
No Fault Found: The Root Cause
Larsson, Erik LU
; Eklow, Bill
; Davidsson, Scott
; Aitken, Rob
; Jutman, Artur
and Lotz, Christophe
(2015)
IEEE VLSI Test Symposium
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Access Time Minimization in IEEE 1687 Networks
Krenz-Baath, René ; Ghani Zadegan, Farrokh LU and Larsson, Erik LU
(2015)
International Test Conference (ITC15)
p.1-10
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2014
-
Mark
Design, Verification and Application of IEEE 1687
Ghani Zadegan, Farrokh LU ; Larsson, Erik LU
; Jutman, Artur
; Devadze, Sergei
and Krenz-Baath, René
(2014)
Asian Test Symposium (ATS14)
p.93-100
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Evaluation of Level of Confidence and Optimization of Roll-back Recovery with Checkpointing for Real-Time Systems
Nikolov, Dimitar LU ; Ingelsson, Urban ; Singh, Virendra and Larsson, Erik LU
(2014)
In Microelectronics and Reliability
54(5).
p.1022-1049
- Contribution to journal › Article
-
Mark
Test Planning and Test Access Mechanism Design for Stacked Chips using ILP
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Fault injection and fault handling: an MPSoC demonstrator using IEEE P1687
Petersen, Kim ; Nikolov, Dimitar LU ; Ingelsson, Urban ; Carlsson, Gunnar ; Ghani Zadegan, Farrokh LU and Larsson, Erik LU
(2014)
20th IEEE International On-Line Testing Symposium
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding