Jiongjiong Mo (Former)

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2016
Mark Effect of Gate Voltage Stress on InGaAs MOSFET with HfO₂ or Al₂O₃ Dielectric
Roll, Guntrade ^LU ; Mo, Jiongjiong ^LU ; Lind, Erik ^LU ; Johansson, Sofia ^LU and Wernersson, Lars Erik ^LU (2016) In IEEE Transactions on Device and Materials Reliability 16(2). p.112-116
- Contribution to journal › Article
2015
Mark InP Drain Engineering in Asymmetric InGaAs/InP MOSFETs
Mo, Jiongjiong ^LU ; Lind, Erik ^LU and Wernersson, Lars-Erik ^LU (2015) In IEEE Transactions on Electron Devices 62(2). p.501-506
- Contribution to journal › Article
Mark Defect evaluation in InGaAs field effect transistors with HfO2 or Al2O3 dielectric
Roll, Guntrade ^LU ; Mo, Jiongjiong ^LU ; Lind, Erik ^LU ; Johansson, Sofia ^LU and Wernersson, Lars-Erik ^LU (2015) In Applied Physics Letters 106(20).
- Contribution to journal › Article
2014
Mark In GaAs MOSFETs with InP Drain
Mo, Jiongjiong ^LU ; Lind, Erik ^LU and Wernersson, Lars-Erik ^LU (2014) 72nd Annual Device Research Conference (DRC) p.119-120
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Asymmetric InGaAs MOSFETs with InGaAs source and InP drain
Mo, Jiongjiong ^LU ; Lind, Erik ^LU and Wernersson, Lars-Erik ^LU (2014) 26th International Conference on Indium Phosphide and Related Materials (IPRM)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Asymmetric InGaAs/InP MOSFETs With Source/Drain Engineering
Mo, Jiongjiong ^LU ; Lind, Erik ^LU and Wernersson, Lars-Erik ^LU (2014) In IEEE Electron Device Letters 35(5). p.515-517
- Contribution to journal › Article
Mark Reduction of off-state drain leakage in InGaAs-based metal-oxide-semiconductor field-effect transistors
Mo, Jiongjiong ^LU ; Lind, Erik ^LU ; Roll, Guntrade ^LU and Wernersson, Lars-Erik ^LU (2014) In Applied Physics Letters 105(3).
- Contribution to journal › Article
2013
Mark Characterization of Border Traps in III-V MOSFETs Using an RF Transconductance Method
Johansson, Sofia ^LU ; Mo, Jiongjiong ^LU and Lind, Erik ^LU (2013) 43rd Conference on European Solid-State Device Research p.53-56
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding