Guntrade Roll (Former)

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2016
Mark Effect of Gate Voltage Stress on InGaAs MOSFET with HfO₂ or Al₂O₃ Dielectric
Roll, Guntrade ^LU ; Mo, Jiongjiong ^LU ; Lind, Erik ^LU ; Johansson, Sofia ^LU and Wernersson, Lars Erik ^LU (2016) In IEEE Transactions on Device and Materials Reliability 16(2). p.112-116
- Contribution to journal › Article
2015
Mark Defect evaluation in InGaAs field effect transistors with HfO2 or Al2O3 dielectric
Roll, Guntrade ^LU ; Mo, Jiongjiong ^LU ; Lind, Erik ^LU ; Johansson, Sofia ^LU and Wernersson, Lars-Erik ^LU (2015) In Applied Physics Letters 106(20).
- Contribution to journal › Article
2014
Mark Reduction of off-state drain leakage in InGaAs-based metal-oxide-semiconductor field-effect transistors
Mo, Jiongjiong ^LU ; Lind, Erik ^LU ; Roll, Guntrade ^LU and Wernersson, Lars-Erik ^LU (2014) In Applied Physics Letters 105(3).
- Contribution to journal › Article
Mark Radio-Frequency Characterization of Selectively Regrown InGaAs Lateral Nanowire MOSFETs
Zota, Cezar ^LU ; Roll, Guntrade ^LU ; Wernersson, Lars-Erik ^LU and Lind, Erik ^LU (2014) In IEEE Transactions on Electron Devices 61(12). p.4078-4083
- Contribution to journal › Article
Mark RF and DC Analysis of Stressed InGaAs MOSFETs
Roll, Guntrade ^LU ; Lind, Erik ^LU ; Egard, Mikael ; Johansson, Sofia ^LU ; Ohlsson, Lars ^LU and Wernersson, Lars-Erik ^LU (2014) In IEEE Electron Device Letters 35(2). p.181-183
- Contribution to specialist publication or newspaper › Specialist publication article
2013
Mark RF reliability of gate last InGaAs nMOSFETs with high-k dielectric
Roll, Guntrade ^LU ; Egard, Mikael ^LU ; Johannson, Sofia ^LU ; Ohlsson, Lars ^LU ; Wernersson, Lars Erik ^LU and Lind, Erik ^LU (2013) 2013 IEEE International Integrated Reliability Workshop Final Report, IIRW 2013 p.38-41
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding