Olof Persson (Former)
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- 2018
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Mark
Self-cleaning and surface chemical reactions during hafnium dioxide atomic layer deposition on indium arsenide
(
- Contribution to journal › Article
- 2017
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Mark
Development of new characterization techniques for III-V nanowire devices
2017)(
- Thesis › Doctoral thesis (compilation)
- 2015
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Mark
Scanning Tunneling Spectroscopy on InAs-GaSb Esaki Diode Nanowire Devices during Operation.
(
- Contribution to journal › Article
- 2014
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Mark
Strong Schottky barrier reduction at Au-catalyst/GaAs-nanowire interfaces by electric dipole formation and Fermi-level unpinning
(
- Contribution to journal › Article
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Mark
High resolution scanning gate microscopy measurements on InAs/GaSb nanowire Esaki diode devices
(
- Contribution to journal › Article
- 2013
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Mark
Interface characterization of metal-HfO2-InAs gate stacks using hard x-ray photoemission spectroscopy
(
- Contribution to journal › Article
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Mark
Current−Voltage Characterization of Individual As-Grown Nanowires Using a Scanning Tunneling Microscope
(
- Contribution to journal › Article
- 2012
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Mark
Atomic Surface Structure and Electronic Properties of Semiconductor Nanowires Studied by Scanning Tunneling Microscopy and Spectroscopy
2012) ICPS 2012(
- Contribution to conference › Abstract