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Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

Favre-Nicolin, V.; Mastropietro, F.; Eymery, J.; Camacho, D.; Niquet, Y. M.; Borg, Mattias LU ; Messing, Maria LU ; Wernersson, Lars-Erik LU ; Algra, R. E. and Bakkers, E. P. A. M., et al. (2010) In New Journal of Physics 12.
Abstract
Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.
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publication status
published
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New Journal of Physics
volume
12
publisher
IOP Publishing Ltd.
external identifiers
  • wos:000276349600012
  • scopus:77951607470
ISSN
1367-2630
DOI
10.1088/1367-2630/12/3/035013
language
English
LU publication?
yes
id
90b05e7e-409d-4398-be99-c569df4a7900 (old id 1603644)
date added to LUP
2010-05-17 14:29:48
date last changed
2018-06-24 04:01:58
@article{90b05e7e-409d-4398-be99-c569df4a7900,
  abstract     = {Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.},
  articleno    = {035013},
  author       = {Favre-Nicolin, V. and Mastropietro, F. and Eymery, J. and Camacho, D. and Niquet, Y. M. and Borg, Mattias and Messing, Maria and Wernersson, Lars-Erik and Algra, R. E. and Bakkers, E. P. A. M. and Metzger, T. H. and Harder, R. and Robinson, I. K.},
  issn         = {1367-2630},
  language     = {eng},
  publisher    = {IOP Publishing Ltd.},
  series       = {New Journal of Physics},
  title        = {Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging},
  url          = {http://dx.doi.org/10.1088/1367-2630/12/3/035013},
  volume       = {12},
  year         = {2010},
}