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2013
Mark Time-dependent relaxation of strained silicon-on-insulator lines using a partially coherent x-ray nanobeam
Mastropietro, F. ; Eymery, J. ; Carbone, G. ^LU ; Baudot, S. ; Andrieu, F. and Favre-Nicolin, V. (2013) In Physical Review Letters 111(21).
- Contribution to journal › Article
2011
Mark Coherent x-ray wavefront reconstruction of a partially illuminated Fresnel zone plate
Mastropietro, F. ; Carbone, D. ^LU ; Diaz, A. ; Eymery, J. ; Sentenac, A. ; Metzger, T. H. ; Chamard, V. and Favre-Nicolin, V. (2011) In Optics Express 19(20). p.19223-19232
- Contribution to journal › Article
Mark Three-dimensional high-resolution quantitative microscopy of extended crystals
Godard, P. ; Carbone, G. ^LU ; Allain, M. ; Mastropietro, F. ; Chen, G. ; Capello, L. ; Diaz, A. ; Metzger, T. H. ; Stangl, J. and Chamard, V. (2011) In Nature Communications 2(1).
- Contribution to journal › Article
2010
Mark Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging
Favre-Nicolin, V. ; Mastropietro, F. ; Eymery, J. ; Camacho, D. ; Niquet, Y. M. ; Borg, Mattias ^LU ; Messing, Maria ^LU ; Wernersson, Lars-Erik ^LU ; Algra, R. E. and Bakkers, E. P. A. M. , et al. (2010) In New Journal of Physics 12.
- Contribution to journal › Article

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