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- 2012
-
Mark
X-ray scattering studies of nanodot pattern formation on semiconductor surfaces by low energy ion beam sputtering
2012) p.129-138(
- Chapter in Book/Report/Conference proceeding › Book chapter
- 2011
-
Mark
Three-dimensional diffraction mapping by tuning the X-ray energy
(
- Contribution to journal › Article
-
Mark
Coherent x-ray wavefront reconstruction of a partially illuminated Fresnel zone plate
(
- Contribution to journal › Article
-
Mark
Three-dimensional high-resolution quantitative microscopy of extended crystals
(
- Contribution to journal › Article
- 2010
-
Mark
Three-dimensional X-ray fourier transform holography : The Bragg case
(
- Contribution to journal › Article
-
Mark
Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging
(
- Contribution to journal › Article
- 2009
-
Mark
Ion-induced nanopatterns on semiconductor surfaces investigated by grazing incidence x-ray scattering techniques
(
- Contribution to journal › Article
-
Mark
Transition from smoothing to roughening of ion-eroded GaSb surfaces
(
- Contribution to journal › Article
- 2008
-
Mark
Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputtering
(
- Contribution to journal › Article
-
Mark
X-ray structure analysis of free-standing lipid membranes facilitated by micromachined apertures
(
- Contribution to journal › Article