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- 2007
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Mark
A Heuristic for Concurrent SOC Test Scheduling with Compression and Sharing
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
What Impacts Course Evaluation?
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Mouse S-factors based on monte carlo simulations in the anatomical realistic Moby phantom for internal dosimetry
(
- Contribution to journal › Article
-
Mark
Improved Scan Chain Diagnosis
2007) 15th NXP IC Test Symposium(
- Contribution to conference › Paper, not in proceeding
-
Mark
Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2006
-
Mark
Combined Test Data Compression and Abort-on-Fail Test
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Power-Aware Test Planning in the Early System-On-Chip Design Exploration Process
(
- Contribution to journal › Article
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Mark
System-on-chip test scheduling with reconfigurable core wrappers
(
- Contribution to journal › Article
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Mark
Cycle-Accurate Test Power Modeling and its Application to SoC Test Scheduling
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO
2006) 14th Philips Research IC Test Seminar(
- Contribution to conference › Paper, not in proceeding
- 2005
-
Mark
Introduction to Advanced System-on-Chip Test Design and Optimization
2005) In Frontiers in Electronic Testing(
- Book/Report › Book
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Mark
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
2005) IFIP WG 10.5 Conference on Very Large Scale Integration System-on-Chip {IFIP VLSI-SOC 2005} p.429-434(
- Contribution to conference › Paper, not in proceeding
-
Mark
A Test Data Compression Architecture with Abort-on Fail Capability
2005) IEEE Workshop on RTL and High Level Testing WRTLT(
- Contribution to conference › Paper, not in proceeding
-
Mark
Remote Boundary-Scan System Test Control for the ATCA Standard
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Boundary-Scan Test Control in the ATCA Standard
2005)(
- Contribution to conference › Paper, not in proceeding
-
Mark
Multiple Constraints Driven System-on-Chip Test Time Optimization
(
- Contribution to journal › Article
-
Mark
Abort-on-Fail Based Test Scheduling
(
- Contribution to journal › Article
-
Mark
Emerging strategies for resource-constrained testing of system chips
2005)(
- Other contribution › Miscellaneous
-
Mark
Efficient time-recursive implementation of matched filterbank spectral. estimators
2005) In IEEE Transactions on Circuits and Systems Part 1: Fundamental Theory and Applications 52(3). p.516-521(
- Contribution to journal › Article
-
Mark
Optimization of a Bus-based Test Data Transportation Mechanism in System-on-Chip
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding