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2019
Mark Functional port for accessing on-chip instruments
Larsson, Erik ^LU (2019) Nordic Test Forum, 2019
- Contribution to conference › Paper, not in proceeding
Mark Test Flow Selection for Stacked Integrated Circuits
SenGupta, Breeta ^LU ; Nikolov, Dimitar ^LU ; Dash, Assmitra and Larsson, Erik ^LU (2019) In Journal of Electronic Testing: Theory and Applications 35(4). p.425-440
- Contribution to journal › Article
Mark IEEE Std. P1687.1: translator and protocol
Larsson, Erik ^LU ; Murali, Prathamesh and Kumisbek, Gani (2019) International Test Conference (ITC)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2018
Mark On-Chip Fault Monitoring Using Self-Reconfiguring IEEE 1687 Networks
Ghani Zadegan, Farrokh ^LU ; Nikolov, Dimitar ^LU and Larsson, Erik ^LU (2018) In IEEE Transactions on Computers 67(2). p.237-251
- Contribution to journal › Article
Mark Systemkretsar ställer nya krav på testningen
Larsson, Erik ^LU (2018) In Elektroniktidningen p.14-14
- Contribution to specialist publication or newspaper › Newspaper article
Mark Test of Reconfigurable Modules in Scan Networks
Cantoro, Riccardo ; Ghani Zadegan, Farrokh ^LU ; Palena, Marco ; Pasini, Paolo ; Larsson, Erik ^LU and Sonza Reorda, Matteo (2018) In IEEE Transactions on Computers 67(12). p.1806-1817
- Contribution to journal › Article
2017
Mark Test Planning for Core-based Integrated Circuits under Power Constraints
SenGupta, Breeta ^LU ; Nikolov, Dimitar ^LU ; Ingelsson, Urban and Larsson, Erik ^LU (2017) In Journal of Electronic Testing: Theory and Applications 33(1). p.7-23
- Contribution to journal › Article
Mark Clustered checkpointing: Maximizing the level of confidence for non-equidistant checkpointing
Nikolov, Dimitar ^LU and Larsson, Erik ^LU (2017) In Integration, the VLSI Journal 58. p.549-562
- Contribution to journal › Article
Mark BASTION: Board and SoC test instrumentation for ageing and no failure found
Jutman, Artur ; Lotz, Christophe ; Larsson, Erik ^LU ; Sonza Reorda, Matteo ; Jenihhin, Maksim ; Raik, Jaan ; Kerkhoff, Hans ; Krenz-Baath, Rene and Engelke, Piet (2017) In Proceedings (Design, Automation, and Test in Europe Conference and Exhibition. Online) p.115-120
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Fault Extraction in Self-Reconfiguring IEEE 1687 Networks
Ghani Zadegan, Farrokh ^LU ; Nikolov, Dimitar ^LU and Larsson, Erik ^LU (2017) 2nd Test Standards Application Workshop
- Contribution to conference › Paper, not in proceeding

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