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2005
Mark Optimization of a Bus-based Test Data Transportation Mechanism in System-on-Chip
Larsson, Anders ; Larsson, Erik ^LU ; Eles, Petru Ion and Peng, Zebo (2005) 8th Euromicro Conference on Digital System Design DSD 2005 p.403-409
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark SOC Test Scheduling with Test Set Sharing and Broadcasting
Larsson, Anders ; Larsson, Erik ^LU ; Eles, Petru Ion and Peng, Zebo (2005) IEEE Asian Test Symposium p.162-162
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Automatic generation of application-specific systems based on a micro-programmed Java core
Gruian, Flavius ^LU ; Andersson, Per ^LU ; Kuchcinski, Krzysztof ^LU and Schoeberl, M (2005) 20th Annual ACM Symposium on Applied Computing 1. p.879-884
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Multiple Constraints Driven System-on-Chip Test Time Optimization
Pouget, Julien ; Larsson, Erik ^LU and Peng, Zebo (2005) In Journal of Electronic Testing 21(6). p.599-611
- Contribution to journal › Article
2004
Mark Defect-Aware SOC Test Scheduling
Larsson, Erik ^LU ; Pouget, Julien and Peng, Zebo (2004) 2004 IEEE VLSI Test Symposium VTS04 p.359-364
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Integrating Core Selection in the SOC Test Solution Design-Flow
Larsson, Erik ^LU (2004) International Test conference ITC04 p.1349-1358
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark A Technique for Optimization of System-on-Chip Test Data Transportation
Larsson, Anders ; Larsson, Erik ^LU ; Eles, Petru Ion and Peng, Zebo (2004) 9th IEEE European Test Symposium, 2004 p.179-180
- Contribution to conference › Paper, not in proceeding
2003
Mark Buffer and Controller Minimization for Time-Constrained Testing of System-On-Chip
Larsson, Anders ; Larsson, Erik ^LU ; Eles, Petru Ion and Peng, Zebo (2003) 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems DFT03 p.385-392
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark An Efficient Approach to SoC Wrapper Design, TAM Configuration and Test Scheduling
Pouget, Julien ; Larsson, Erik ^LU ; Peng, Zebo ; Flottes, Marie-Lise and Rouzeyre, Bruno (2003) IEEE European Test Workshop 2003 ETW03 p.51-56
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark SOC Test Time Minimization Under Multiple Constraints
Pouget, Julien ; Larsson, Erik ^LU and Peng, Zebo (2003) 12th IEEE Asian Test Symposium ATS 2003 p.312-317
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding

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