LTH School of Engineering in Helsingborg

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2023
Mark Threats to validity in software engineering research: A critical reflection
Verdecchia, Roberto ; Engström, Emelie ^LU ; Lago, Patricia ; Runeson, Per ^LU and Song, Qunying ^LU (2023) In Information and Software Technology
- Contribution to journal › Article
Mark Secure reuse of DfT during operation
Larsson, Erik ^LU (2023) Nordic Test Forum
- Contribution to conference › Paper, not in proceeding
2022
Mark Reusing IEEE 1687-Compatible Instruments and Sub-Networks over a System Bus
Ghani Zadegan, Farrokh ^LU ; Zhang, Zilin ; Peterse ́n, Kim and Larsson, Erik ^LU (2022) p.219-228
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Graceful degradation to prolong lifetime of semiconductors
Larsson, Erik ^LU (2022) Knowledge for Sustainable Development
– Lund University Research Conference
- Contribution to conference › Poster
Mark Exploring ML testing in practice - Lessons learned from an interactive rapid review with Axis Communications
Song, Qunying ^LU ; Borg, Markus ^LU ; Engström, Emelie ^LU ; Ardö, Håkan and Rico, Sergio ^LU (2022) 2022 IEEE/ACM 1st International Conference on AI Engineering – Software Engineering for AI (CAIN)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2021
Mark Accessing general IEEE Std. 1687 networks via functional ports
Larsson, Erik ^LU ; Murali, Prathamesh and Zhang, Zilin ^LU (2021) p.354-363
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Closing the Feedback Loop in DevOps Through Autonomous Monitors in Operations
Hrusto, Adha ^LU ; Runeson, Per ^LU and Engström, Emelie ^LU (2021) In SN Computer Science 2(6).
- Contribution to journal › Article
Mark System-Level Access to On-Chip Instruments
Larsson, Erik ^LU ; Kiran Gangaraju, Shashi and Murali, Prathamesh (2021) 26th IEEE European Test Symposium (ETS) , 2021 p.1-6
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Graceful Degradation of Reconfigurable Scan Networks
Larsson, Erik ^LU ; Xiang, Zehang and Murali, Prathamesh (2021) In IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29(7). p.1475-1479
- Contribution to journal › Scientific review
Mark Access to on-chip test structures via functional buses
Larsson, Erik ^LU (2021) Nordic Test Forum
- Contribution to conference › Other

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