Lars Samuelson
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- 2015
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Mark
X-ray diffraction strain analysis of a single axial InAs1-xPx nanowire segment.
- Contribution to journal › Article
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Mark
Study of carrier concentration in single InP nanowires by luminescence and Hall measurements
- Contribution to journal › Article
-
Mark
Measurement of strain in InGaN/GaN nanowires and nanopyramids
- Contribution to journal › Article
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Mark
Nanofocused x-ray beams applied for mapping strain in core-shell nanowires
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Nanowire Technology for GaAsP/Si Tandem Cells Beyond 25% Efficiency
(2015) EWMOVPE XVI
- Contribution to conference › Abstract
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Mark
Evaluation of Nanowire Length and Diameter In-Situ from Optical Reflectance Spectra
(2015)
- Contribution to conference › Abstract
-
Mark
Processing and characterization of nanowire arrays for photodetectors
(2015) p.511-512
- Chapter in Book/Report/Conference proceeding › Book chapter
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Mark
NANOWIRES-Materials Research for Real-World Applications
(2015) KAUST Research Conference on Functional Nanomaterials: Design, Synthesis, and Applications
- Contribution to conference › Paper, not in proceeding
-
Mark
Nanowires- basic materials science creating real-world applications
(2015) Nanoelectronic Days 2015
- Contribution to conference › Paper, not in proceeding
-
Mark
Nanowire-based energy applications of wurtzite & zincblende semiconductors
(2015) MRS Spring-meeting 2015
- Contribution to conference › Paper, not in proceeding
