Erik Larsson
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- 2006
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Mark
Combined Test Data Compression and Abort-on-Fail Test
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Power-Aware Test Planning in the Early System-On-Chip Design Exploration Process
(
- Contribution to journal › Article
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Mark
System-on-chip test scheduling with reconfigurable core wrappers
(
- Contribution to journal › Article
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Mark
High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO
2006) 14th Philips Research IC Test Seminar(
- Contribution to conference › Paper, not in proceeding
- 2005
-
Mark
SOC Test Scheduling with Test Set Sharing and Broadcasting
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Remote Boundary-Scan System Test Control for the ATCA Standard
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Introduction to Advanced System-on-Chip Test Design and Optimization
2005) In Frontiers in Electronic Testing(
- Book/Report › Book
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Mark
Abort-on-Fail Based Test Scheduling
(
- Contribution to journal › Article
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Mark
Multiple Constraints Driven System-on-Chip Test Time Optimization
(
- Contribution to journal › Article
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Mark
Optimization of a Bus-based Test Data Transportation Mechanism in System-on-Chip
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding