Erik Larsson
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- 2019
-
Mark
Test Flow Selection for Stacked Integrated Circuits
(
- Contribution to journal › Article
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Mark
Functional port for accessing on-chip instruments
2019) Nordic Test Forum, 2019(
- Contribution to conference › Paper, not in proceeding
-
Mark
Maintainability of large-scale IoT
2019) DTU High Tech Summit(
- Contribution to conference › Paper, not in proceeding
- 2018
-
Mark
Systemkretsar ställer nya krav på testningen
(
- Contribution to specialist publication or newspaper › Newspaper article
-
Mark
On-Chip Fault Monitoring Using Self-Reconfiguring IEEE 1687 Networks
(
- Contribution to journal › Article
-
Mark
Test of Reconfigurable Modules in Scan Networks
(
- Contribution to journal › Article
- 2017
-
Mark
Clustered checkpointing: Maximizing the level of confidence for non-equidistant checkpointing
(
- Contribution to journal › Article
-
Mark
BASTION: Board and SoC test instrumentation for ageing and no failure found
2017) In Proceedings (Design, Automation, and Test in Europe Conference and Exhibition. Online) p.115-120(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Fault Extraction in Self-Reconfiguring IEEE 1687 Networks
2017) 2nd Test Standards Application Workshop(
- Contribution to conference › Paper, not in proceeding
-
Mark
Reducing Pessimism in Upper-Bound Computation for Optimal IEEE 1687 Retargeting
2017) 2nd Test Standards Application Workshop(
- Contribution to conference › Paper, not in proceeding