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2020
Mark Effects of traps in the gate stack on the small-signal RF response of III-V nanowire MOSFETs
Hellenbrand, Markus ^LU ; Lind, Erik ^LU ; Kilpi, Olli-Pekka ^LU and Wernersson, Lars-Erik ^LU (2020) In Solid-State Electronics 171.
- Contribution to journal › Article
2019
Mark Low-Frequency Noise in Nanowire and Planar III-V MOSFETs
Hellenbrand, Markus ^LU ; Kilpi, Olli-Pekka ^LU ; Svensson, Johannes ^LU ; Lind, Erik ^LU and Wernersson, Lars-Erik ^LU (2019) In Microelectronic Engineering
- Contribution to journal › Article
2016
Mark Electrical Characterization of III-V Nanostructure
Shiri Babadi, Aein ^LU (2016)
- Thesis › Doctoral thesis (compilation)
2014
Mark Vertical Nanowire High-Frequency Transistors
Johansson, Sofia ^LU (2014)
- Thesis › Doctoral thesis (compilation)
2013
Mark A High-Frequency Transconductance Method for Characterization of High-k Border Traps in III-V MOSFETs
Johansson, Sofia ^LU ; Berg, Martin ^LU ; Persson, Karl-Magnus ^LU and Lind, Erik ^LU (2013) In IEEE Transactions on Electron Devices 60(2). p.776-781
- Contribution to journal › Article

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