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- 2024
-
Mark
Cryogenic Ferroelectricity of HZO Capacitors on a III-V Semiconductor
Ram, Mamidala Karthik LU
; Dahlberg, Hannes
LU
and Wernersson, Lars Erik
LU
(2024)
In IEEE Electron Device Letters
45(10).
p.1827-1830
- Contribution to journal › Article
-
Mark
III-V Devices for Emerging Electronic Applications
(2024)
- Thesis › Doctoral thesis (compilation)
- 2023
-
Mark
Electrically active defects in Al2O3-InGaAs MOS stacks at cryogenic temperatures
(2023) 2023 IEEE International Integrated Reliability Workshop, IIRW 2023 In IEEE International Integrated Reliability Workshop Final Report
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Geometrical Magnetoresistance as a Tool for Carrier Mobility Extraction in InGaAs MOSFETs
Olausson, Patrik LU and Lind, Erik LU
(2023)
In IEEE Transactions on Electron Devices
70(11).
p.5614-5618
- Contribution to journal › Article
- 2022
-
Mark
Low-Temperature Characteristics of Nanowire Network Demultiplexer for Qubit Biasing
Södergren, Lasse LU ; Olausson, Patrik LU and Lind, Erik LU
(2022)
In Nano Letters
22(10).
p.3884-3888
- Contribution to journal › Article
-
Mark
InGaAs Nanowire and Quantum Well Devices
(2022)
- Thesis › Doctoral thesis (compilation)
- 2020
-
Mark
Electrical Characterisation of III-V Nanowire MOSFETs
(2020) In Series of Licentiate and Doctoral Theses
- Thesis › Doctoral thesis (compilation)
- 2014
-
Mark
Waste Heat Recovery from the European Spallation Source Cryogenic Helium Plants - Implications for System Design
(2014) Joint Conference of the Transactions of the Cryogenic Engineering Conference (CEC) / Transactions of the International Cryogenic Materials Conference 1573. p.647-654
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding