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- 2025
-
Mark
Memory State Dynamics in BEOL FeFETs : Impact of Area Ratio on Analog Write Mechanisms and Charging
- Contribution to journal › Article
-
Mark
Oxygen Vacancy Dynamics in Different Switching Modes of Hf0.5Zr0.5O2−δ
- Contribution to journal › Article
- 2024
-
Mark
RF Characterization of Ferroelectric MOS Capacitors
- Contribution to journal › Article
- 2023
-
Mark
Dynamics of Polarization Switching in Mixed Phase Ferroelectric-Antiferroelectric HZO Thin Films
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Impact of Temperature-Induced Oxide Defects on HfxZr1−xO2 Ferroelectric Tunnel Junction Memristor Performance
- Contribution to journal › Article
-
Mark
Integration of Ferroelectric HfO2 onto a III-V Nanowire Platform
- Thesis › Doctoral thesis (compilation)
