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2025
Mark Memory State Dynamics in BEOL FeFETs : Impact of Area Ratio on Analog Write Mechanisms and Charging
Dahlberg, Hannes ^LU ; Kaatranen, Oscar ; Persson, Karl Magnus ^LU ; Rantala, Arto ; Flak, Jacek and Wernersson, Lars Erik ^LU (2025) In IEEE Access 13. p.9923-9930
- Contribution to journal › Article
2024
Mark RF Characterization of Ferroelectric MOS Capacitors
Persson, Anton E.O. ^LU ; Andric, Stefan ^LU ; Fhager, Lars ^LU and Wernersson, Lars Erik ^LU (2024) In IEEE Electron Device Letters 45(9). p.1653-1656
- Contribution to journal › Article
2023
Mark Dynamics of Polarization Switching in Mixed Phase Ferroelectric-Antiferroelectric HZO Thin Films
Dahlberg, Hannes ^LU and Wernersson, Lars-Erik ^LU (2023) IEEE 53rd European Solid-State Device Research Conference (ESSDERC) p.33-36
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Integration of Ferroelectric HfO₂ onto a III-V Nanowire Platform
Persson, Anton E. O. ^LU (2023) In Licentiate and Doctoral Theses 156(156).
- Thesis › Doctoral thesis (compilation)
Mark Impact of Temperature-Induced Oxide Defects on Hf_xZr_1−xO₂ Ferroelectric Tunnel Junction Memristor Performance
Athle, Robin ^LU and Borg, Mattias ^LU (2023) In IEEE Transactions on Electron Devices 70(3). p.1412-1416
- Contribution to journal › Article

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