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- 2023
-
Mark
Effects of Interface Oxidation on Noise Properties and Performance in III–V Vertical Nanowire Memristors
Mamidala, Saketh Ram LU
; Svensson, Johannes
LU
and Wernersson, Lars-Erik
LU
(2023)
In ACS Applied Materials and Interfaces
15(15).
- Contribution to journal › Article
- 2020
-
Mark
Electrical Characterisation of III-V Nanowire MOSFETs
(2020) In Series of Licentiate and Doctoral Theses
- Thesis › Doctoral thesis (compilation)
- 2019
-
Mark
Comparison of Low-Frequency Noise in Nanowire and Planar III-V MOSFETs
Hellenbrand, Markus LU ; Kilpi, Olli-Pekka LU ; Svensson, Johannes LU ; Lind, Erik LU
and Wernersson, Lars-Erik
LU
(2019)
Insulating Films on Semiconductors (INFOS)
- Contribution to conference › Paper, not in proceeding
-
Mark
Low-Frequency Noise in Nanowire and Planar III-V MOSFETs
Hellenbrand, Markus LU ; Kilpi, Olli-Pekka LU ; Svensson, Johannes LU ; Lind, Erik LU
and Wernersson, Lars-Erik
LU
(2019)
In Microelectronic Engineering
- Contribution to journal › Article
- 2017
-
Mark
Low-Frequency Noise in III-V Nanowire TFETs and MOSFETs
(2017) In IEEE Electron Device Letters
- Contribution to journal › Letter
- 2012
-
Mark
1/f Noise Sources in Dual-Gated Indium Arsenide Nanowire Transistors
Delker, Collin J. ; Kim, Seongmin ; Borg, Mattias LU
; Wernersson, Lars-Erik
LU
and Janes, David B.
(2012)
In IEEE Transactions on Electron Devices
59(7).
p.1980-1987
- Contribution to journal › Article