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2007
Mark Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
Larsson, Erik ^LU and Edbom, Stina (2007) p.221-244
- Chapter in Book/Report/Conference proceeding › Book chapter
Mark Protocol Requirements in an SJTAG/IJTAG Environment
Carlsson, Gunnar ; Holmqvist, Johan and Larsson, Erik ^LU (2007) International Test Conference, 2007 p.1-3
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Protocol Requirements in an SJTAG/IJTAG Environment
Larsson, Erik ^LU ; Carlsson, Gunnar and Holmqvist, Johan (2007) Nordic Test Forum NTF,2007
- Contribution to conference › Paper, not in proceeding
2006
Mark Cycle-Accurate Test Power Modeling and its Application to SoC Test Scheduling
Samii, Soheil ; Larsson, Erik ^LU ; Chakrabarty, Krishnendu and Peng, Zebo (2006) IEEE International Test Conference ITC '06 p.1-32
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Combined Test Data Compression and Abort-on-Fail Test
Larsson, Erik ^LU (2006) NORCHIP Conference, 2006 p.137-140
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO
Dubois, Tobias ; Azimane, Mohamed ; Larsson, Erik ^LU ; Marinissen, Erik Jan ; Wielage, Paul and Wouters, Clemens (2006) 14th Philips Research IC Test Seminar
- Contribution to conference › Paper, not in proceeding
2005
Mark Optimization of a Bus-based Test Data Transportation Mechanism in System-on-Chip
Larsson, Anders ; Larsson, Erik ^LU ; Eles, Petru Ion and Peng, Zebo (2005) 8th Euromicro Conference on Digital System Design DSD 2005 p.403-409
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Test Scheduling for Modular SOCs in an Abort-on-Fail Environment
Ingelsson, Urban ; Goel, Sandeep Kumar ; Larsson, Erik ^LU and Marinissen, Erik Jan (2005) IEEE European Test Symposium ETS 05, 2005 p.8-13
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Multiple Constraints Driven System-on-Chip Test Time Optimization
Pouget, Julien ; Larsson, Erik ^LU and Peng, Zebo (2005) In Journal of Electronic Testing 21(6). p.599-611
- Contribution to journal › Article
Mark Abort-on-Fail Based Test Scheduling
Larsson, Erik ^LU ; Pouget, Julien and Peng, Zebo (2005) In Journal of Electronic Testing 21(6). p.651-658
- Contribution to journal › Article

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