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- 2020
-
Mark
Effects of traps in the gate stack on the small-signal RF response of III-V nanowire MOSFETs
Hellenbrand, Markus LU ; Lind, Erik LU
; Kilpi, Olli-Pekka
LU
and Wernersson, Lars-Erik
LU
(2020)
In Solid-State Electronics
171.
- Contribution to journal › Article
- 2019
-
Mark
Low-Frequency Noise in Nanowire and Planar III-V MOSFETs
Hellenbrand, Markus LU ; Kilpi, Olli-Pekka LU ; Svensson, Johannes LU ; Lind, Erik LU
and Wernersson, Lars-Erik
LU
(2019)
In Microelectronic Engineering
- Contribution to journal › Article
- 2016
-
Mark
Electrical Characterization of III-V Nanostructure
(2016)
- Thesis › Doctoral thesis (compilation)
- 2014
-
Mark
Vertical Nanowire High-Frequency Transistors
(2014)
- Thesis › Doctoral thesis (compilation)
- 2013
-
Mark
A High-Frequency Transconductance Method for Characterization of High-k Border Traps in III-V MOSFETs
Johansson, Sofia LU ; Berg, Martin LU ; Persson, Karl-Magnus LU and Lind, Erik LU
(2013)
In IEEE Transactions on Electron Devices
60(2).
p.776-781
- Contribution to journal › Article