Farrokh Ghani Zadegan (Former)
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- 2022
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Mark
Reusing IEEE 1687-Compatible Instruments and Sub-Networks over a System Bus
2022) p.219-228(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2018
-
Mark
Test of Reconfigurable Modules in Scan Networks
(
- Contribution to journal › Article
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Mark
On-Chip Fault Monitoring Using Self-Reconfiguring IEEE 1687 Networks
(
- Contribution to journal › Article
- 2017
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Mark
Fault Extraction in Self-Reconfiguring IEEE 1687 Networks
2017) 2nd Test Standards Application Workshop(
- Contribution to conference › Paper, not in proceeding
-
Mark
Reducing Pessimism in Upper-Bound Computation for Optimal IEEE 1687 Retargeting
2017) 2nd Test Standards Application Workshop(
- Contribution to conference › Paper, not in proceeding
-
Mark
Reconfigurable On-Chip Instrument Access Networks : Analysis, Design, Operation, and Application
2017)(
- Thesis › Doctoral thesis (compilation)
- 2016
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Mark
In-Field System-Health Monitoring Based on IEEE 1687
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
On the diagnostic analysis of IEEE 1687 networks
2016) 21st IEEE European Test Symposium, ETS 2016(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks
2016) 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016 p.167-172(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
On the Testability of IEEE 1687 Networks
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Upper-bound computation for optimal retargeting in IEEE1687 networks
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Towards a Suite of IEEE 1687 Benchmark Networks
2016) Test Standards Application Workshop (TESTA)(
- Contribution to conference › Paper, not in proceeding
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Mark
Retargeting Challenges in IEEE 1687 Networks
2016) Test Standards Application Workshop (TESTA)(
- Contribution to conference › Paper, not in proceeding
-
Mark
Test, Validation and Diagnosis of IEEE 1687 Networks
2016) Test Standards Application Workshop (TESTA)(
- Contribution to conference › Paper, not in proceeding
-
Mark
A Self-Reconfiguring IEEE 1687 Network for Fault Monitoring
2016) European Test Symposium (ETS), 2016(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Accessing On-chip Instruments Through the Life-time of Systems
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2015
-
Mark
Access Time Minimization in IEEE 1687 Networks
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2014
-
Mark
Design, Verification and Application of IEEE 1687
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Fault injection and fault handling: an MPSoC demonstrator using IEEE P1687
2014) 20th IEEE International On-Line Testing Symposium(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Robustness of TAP-based Scan Networks
2014) IEEE International Test Conference, 2014(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2013
-
Mark
Scenario-Based Network Design for P1687
2013) Swedish System-On-Chip Conference (SSoCC), 2013(
- Contribution to conference › Paper, not in proceeding
- 2012
-
Mark
Accessing Embedded DfT Instruments with IEEE P1687
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687
(
- Contribution to journal › Article
-
Mark
Access Time Analysis for IEEE P1687
(
- Contribution to journal › Article
- 2011
-
Mark
Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Design Automation for IEEE P1687
2011) Design, Automation and Test in Europe (DATE 2011),(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
A Study of Instrument Reuse and Retargeting in P1687
2011) IEEE Twelfth Workshop on RTL and High Level Testing (WRTLT 2011)(
- Contribution to conference › Paper, not in proceeding
- 2010
-
Mark
Test scheduling on IJTAG
2010) Nordic Test Forum (NTF 2010),(
- Contribution to conference › Paper, not in proceeding
-
Mark
Test Time Analysis for IEEE P1687
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding