LTH School of Engineering in Helsingborg

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2021
Mark Accessing general IEEE Std. 1687 networks via functional ports
Larsson, Erik ^LU ; Murali, Prathamesh and Zhang, Zilin ^LU (2021) p.354-363
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark System-Level Access to On-Chip Instruments
Larsson, Erik ^LU ; Kiran Gangaraju, Shashi and Murali, Prathamesh (2021) 26th IEEE European Test Symposium (ETS) , 2021 p.1-6
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Graceful Degradation of Reconfigurable Scan Networks
Larsson, Erik ^LU ; Xiang, Zehang and Murali, Prathamesh (2021) In IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29(7). p.1475-1479
- Contribution to journal › Scientific review
Mark Closing the Feedback Loop in DevOps Through Autonomous Monitors in Operations
Hrusto, Adha ^LU ; Runeson, Per ^LU and Engström, Emelie ^LU (2021) In SN Computer Science 2(6).
- Contribution to journal › Article
Mark Användning av CEQ:s TM-skala för projektbaserade kurser
Motte, Damien ^LU ; Eftring, Håkan ^LU ; Elner-Haglund, Katarina ^LU ; Rassmus-Gröhn, Kirsten ^LU ; Sjögren, Anders ^LU and Jensen, Lise ^LU (2021) LTH:s 11:e pedagogiska inspirationskonferens, 2021 In Proceedings från LTH:s Pedagogiska inspirationskonferens p.9-12
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Access to on-chip test structures via functional buses
Larsson, Erik ^LU (2021) Nordic Test Forum
- Contribution to conference › Other
2018
Mark Tydligare mål och förväntningar i projektbaserade kurser
Motte, Damien ^LU ; Jensen, Lise ^LU ; Eftring, Håkan ^LU ; Elner-Haglund, Katarina ^LU ; Rassmus-Gröhn, Kirsten ^LU and Sjögren, Anders ^LU (2018) LTH:s 10:e pedagogiska inspirationskonferens, 2018 In Proceedings från LTH:s Pedagogiska inspirationskonferens p.52-55
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2017
Mark BASTION: Board and SoC test instrumentation for ageing and no failure found
Jutman, Artur ; Lotz, Christophe ; Larsson, Erik ^LU ; Sonza Reorda, Matteo ; Jenihhin, Maksim ; Raik, Jaan ; Kerkhoff, Hans ; Krenz-Baath, Rene and Engelke, Piet (2017) In Proceedings (Design, Automation, and Test in Europe Conference and Exhibition. Online) p.115-120
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Fault Extraction in Self-Reconfiguring IEEE 1687 Networks
Ghani Zadegan, Farrokh ^LU ; Nikolov, Dimitar ^LU and Larsson, Erik ^LU (2017) 2nd Test Standards Application Workshop
- Contribution to conference › Paper, not in proceeding
Mark Reducing Pessimism in Upper-Bound Computation for Optimal IEEE 1687 Retargeting
Ghani Zadegan, Farrokh ^LU ; Krenz-Baath, Rene and Larsson, Erik ^LU (2017) 2nd Test Standards Application Workshop
- Contribution to conference › Paper, not in proceeding

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