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2020
Mark Soft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range
Makarov, Sergey ; Pikuz, Sergey ; Ryazantsev, Sergey ; Pikuz, Tatiana ; Buzmakov, Alexey ; Rose, Max ; Lazarev, Sergey ; Senkbeil, Tobias ; Von Gundlach, Andreas and Stuhr, Susan , et al. (2020) In Journal of Synchrotron Radiation 27. p.625-632
- Contribution to journal › Article
Mark Diffraction data from aerosolized Coliphage PR772 virus particles imaged with the Linac Coherent Light Source
Li, Haoyuan ; Nazari, Reza ; Abbey, Brian ; Alvarez, Roberto ; Aquila, Andrew ; Ayyer, Kartik ; Barty, Anton ; Berntsen, Peter ; Bielecki, Johan and Pietrini, Alberto , et al. (2020) In Scientific Data 7(1).
- Contribution to journal › Article
2018
Mark Structural Changes in a Single GaN Nanowire under Applied Voltage Bias
Lazarev, Sergey ; Dzhigaev, Dmitry ^LU ; Bi, Zhaoxia ^LU ; Nowzari, Ali ^LU ; Kim, Young Yong ; Rose, Max ; Zaluzhnyy, Ivan A. ; Gorobtsov, Oleg Yu ; Zozulya, Alexey V. and Lenrick, Filip ^LU , et al. (2018) In Nano Letters 18(9). p.5446-5452
- Contribution to journal › Article
2017
Mark X-ray Bragg Ptychography on a Single InGaN/GaN Core-Shell Nanowire
Dzhigaev, Dmitry ; Stankevič, Tomaš ; Bi, Zhaoxia ^LU ; Lazarev, Sergey ; Rose, Max ; Shabalin, Anatoly ; Reinhardt, Juliane ; Mikkelsen, Anders ^LU ; Samuelson, Lars ^LU and Falkenberg, Gerald , et al. (2017) In ACS Nano 11(7). p.6605-6611
- Contribution to journal › Article
Mark Coherent soft X-ray diffraction imaging of coliphage PR772 at the Linac coherent light source
Reddy, Hemanth K.N. ; Yoon, Chun Hong ; Aquila, Andrew ; Awel, Salah ; Ayyer, Kartik ; Barty, Anton ; Berntsen, Peter ; Bielecki, Johan ; Bobkov, Sergey and Bucher, Maximilian , et al. (2017) In Scientific Data 4.
- Contribution to journal › Article
2016
Mark Coherent diffraction of single Rice Dwarf virus particles using hard X-rays at the Linac Coherent Light Source
Munke, Anna ^LU ; Andreasson, Jakob ; Aquila, Andrew ; Awel, Salah ; Ayyer, Kartik ; Barty, Anton ; Bean, Richard J. ; Berntsen, Peter ; Bielecki, Johan and Boutet, Sébastien , et al. (2016) In Scientific Data 3.
- Contribution to journal › Article
2015
Mark Nanofocused x-ray beams applied for mapping strain in core-shell nanowires
Stankevic, Tomas ; Dzhigaev, Dmitry ; Bi, Zhaoxia ^LU ; Rose, Max ; Shabalin, Anatoly ; Reinhardt, Juliane ; Mikkelsen, Anders ^LU ; Samuelson, Lars ^LU ; Falkenberg, Gerald and Vartanyants, Ivan A. , et al. (2015) Conference on X-Ray Nanoimaging - Instruments and Methods II 9592. p.95920-95920
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Strain mapping in an InGaN/GaN nanowire using a nano-focused x-ray beam
Stankevic, Tomas ; Dzhigaev, Dmitry ; Bi, Zhaoxia ^LU ; Rose, Max ; Shabalin, Anatoly ; Reinhardt, Juliane ; Mikkelsen, Anders ^LU ; Samuelson, Lars ^LU ; Falkenberg, Gerald and Vartanyants, Ivan A. , et al. (2015) In Applied Physics Letters 107(10).
- Contribution to journal › Article

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