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- 2003
-
Mark
Fluorescence microscopy for quality control in nanoimprint lithography
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Lift-off process for nanoimprint lithography
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Nanoimprint-induced effects on electrical and optical properties of quantum well structures
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Dual pass electron beam writing of bit arrays with sub-100 nm bits on imprint lithography masters for patterned media production
(
- Contribution to journal › Article
- 2002
-
Mark
Fabrication of Si-based nanoimprint stamps with sub-20 nm features
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 1999
-
Mark
Single-electron devices via controlled assembly of designed nanoparticles
1999) Proceedings of the 1998 4th International Symposium on New Phenomena in Mesoscopic Structures (NPMS'98) In Microelectronic Engineering 47(1-4). p.179-183(
- Contribution to journal › Article
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