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- 2025
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Mark
Effect of substrate misorientation angle on the structural properties of N-polar GaN grown by hot-wall MOCVD on 4H-SiC(0001̄)
- Contribution to journal › Article
- 2024
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Mark
Characterization of Trapping Effects Related to Carbon Doping Level in AlGaN Back-Barriers for AlGaN/GaN HEMTs
- Contribution to journal › Article
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Mark
Electronic Properties of Group-III Nitride Semiconductors and Device Structures Probed by THz Optical Hall Effect
- Contribution to journal › Article
- 2023
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Mark
High-quality N-polar GaN optimization by multi-step temperature growth process
- Contribution to journal › Article
-
Mark
Structural investigation of ultra-low resistance deeply recessed sidewall ohmic contacts for AlGaN/GaN HEMTs based on Ti/Al/Ti-metallization
- Contribution to journal › Article
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Mark
Polarity Control by Inversion Domain Suppression in N-Polar III-Nitride Heterostructures
- Contribution to journal › Article
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Mark
Observations of very fast electron traps at SiC/high-κ dielectric interfaces
- Contribution to journal › Article
- 2022
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Mark
Impact of in situ NH3 pre-treatment of LPCVD SiN passivation on GaN HEMT performance
- Contribution to journal › Article
- 2020
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Mark
N-polar AlN nucleation layers grown by hot-wall MOCVD on SiC : Effects of substrate orientation on the polarity, surface morphology and crystal quality
- Contribution to journal › Article
