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2013
Mark Time-dependent relaxation of strained silicon-on-insulator lines using a partially coherent x-ray nanobeam
Mastropietro, F. ; Eymery, J. ; Carbone, G. ^LU ; Baudot, S. ; Andrieu, F. and Favre-Nicolin, V. (2013) In Physical Review Letters 111(21).
- Contribution to journal › Article
2011
Mark Coherent x-ray wavefront reconstruction of a partially illuminated Fresnel zone plate
Mastropietro, F. ; Carbone, D. ^LU ; Diaz, A. ; Eymery, J. ; Sentenac, A. ; Metzger, T. H. ; Chamard, V. and Favre-Nicolin, V. (2011) In Optics Express 19(20). p.19223-19232
- Contribution to journal › Article
2010
Mark Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging
Favre-Nicolin, V. ; Mastropietro, F. ; Eymery, J. ; Camacho, D. ; Niquet, Y. M. ; Borg, Mattias ^LU ; Messing, Maria ^LU ; Wernersson, Lars-Erik ^LU ; Algra, R. E. and Bakkers, E. P. A. M. , et al. (2010) In New Journal of Physics 12.
- Contribution to journal › Article
2009
Mark X-ray measurements of the strain and shape of dielectric/metallic wrap-gated InAs nanowires
Eymery, J. ; Favre-Nicolin, V. ; Fröberg, Linus ^LU and Samuelson, Lars ^LU (2009) In Applied Physics Letters 94(13).
- Contribution to journal › Article
2006
Mark Grazing incidence X-ry measurements of epitaxial nanowires
Eymery, J ; Rieutord, F ; Favre-Nicolin, V ; Fröberg, Linus ^LU ; Mårtensson, Thomas ^LU and Samuelson, Lars ^LU (2006) Semiconductor Nanowires Symposium, 2006
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Nanowire-based one-dimensional electronics
Thelander, Claes ^LU ; Agarwal, P. ; Brongersma, S. ; Eymery, J. ; Feiner, L. F. ; Forchel, A. ; Scheffler, M. ; Riess, W. ; Ohlsson, B. J. and Goesele, U. , et al. (2006) In Materials Today 9(10). p.28-35
- Contribution to journal › Article

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