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- 2012
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Mark
Atomic Surface Structure and Electronic Properties of Semiconductor Nanowires Studied by Scanning Tunneling Microscopy and Spectroscopy
(2012) ICPS 2012
- Contribution to conference › Abstract
- 2011
-
Mark
Doping profile of InP nanowires directly imaged by photoemission electron microscopy
- Contribution to journal › Article
-
Mark
Cross-sectional scanning tunneling microscopy and spectroscopy of semimetallic ErAs nanostructures embedded in GaAs
(2011) 27th North American Molecular Beam Epitaxy Conference of the American-Vacuum-Society 29(3). p.03-104
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Interface composition of InAs nanowires with Al2O2 and HfO2 thin films
- Contribution to journal › Article
-
Mark
Interface composition of atomic layer deposited HfO2 and Al2O3 thin films on InAs studied by X-ray photoemission spectroscopy
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Local Density of States and Interface Effects in Semimetallic ErAs Nanoparticles Embedded in GaAs
- Contribution to journal › Letter
- 2010
-
Mark
New Flexible Toolbox for Nanomechanical Measurements with Extreme Precision and at Very High Frequencies.
- Contribution to journal › Article
-
Mark
Reduction of native oxides on InAs by atomic layer deposited Al2O3 and HfO2
- Contribution to journal › Letter
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Mark
High-k oxides on (100), (111)A and (111)B InAs substrates
(2010) EMRS 2010 Spring Meeting on Post-Si-CMOS Electronic Devices - The Role of Ge and III-V Materials
- Contribution to conference › Paper, not in proceeding
-
Mark
Structure, mechanics and conductivity of semiconductor nanowires using scanning tunneling microscopy
(2010) 18th International Vacuum Congress, 2010
- Contribution to conference › Paper, not in proceeding
