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- 2021
-
Mark
Doping Profiles in Ultrathin Vertical VLS-Grown InAs Nanowire MOSFETs with High Performance
Jönsson, Adam LU ; Svensson, Johannes LU ; Fiordaliso, Elisabetta Maria ; Lind, Erik LU
; Hellenbrand, Markus
LU
and Wernersson, Lars Erik
LU
(2021)
In ACS Applied Electronic Materials
3(12).
p.5240-5247
- Contribution to journal › Article
- 2020
-
Mark
Effects of traps in the gate stack on the small-signal RF response of III-V nanowire MOSFETs
Hellenbrand, Markus LU ; Lind, Erik LU
; Kilpi, Olli-Pekka
LU
and Wernersson, Lars-Erik
LU
(2020)
In Solid-State Electronics
171.
- Contribution to journal › Article
-
Mark
Vertical nanowire III–V MOSFETs with improved high-frequency gain
Kilpi, Olli-Pekka LU ; Hellenbrand, Markus LU ; Svensson, Johannes LU ; Lind, Erik LU
and Wernersson, Lars-Erik
LU
(2020)
In Electronics Letters
56(13).
p.669-671
- Contribution to journal › Article
- 2018
-
Mark
Effect of Gate Oxide Defects on Tunnel Transistor RF Performance
Hellenbrand, Markus LU ; Memisevic, Elvedin LU ; Svensson, Johannes LU ; Krishnaraja, Abinaya LU ; Lind, Erik LU
and Wernersson, Lars-Erik
LU
(2018)
76th Device Research Conference
p.137-138
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2017
-
Mark
Random telegraph signal noise in tunneling field-effect transistors with S below 60 mV/decade
Hellenbrand, Markus LU ; Memisevic, Elvedin LU ; Svensson, Johannes LU ; Lind, Erik LU
and Wernersson, Lars-Erik
LU
(2017)
p.38-41
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding