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2024
Mark Detection of Very Fast Interface Traps at 4H-SiC/AlN and 4H-SiC/Al2O3 Interfaces
Vidarsson, A. M. ; Persson, A. R. ; Chen, J. T. ^LU ; Haasmann, D. ; Hassan, J. ; Dimitrijev, S. ; Rorsman, N. ; Darakchieva, V. ^LU and Sveinbjörnsson, E. (2024) 358. p.59-64
- Chapter in Book/Report/Conference proceeding › Book chapter
2023
Mark Spectrally Tunable Broadband Gate-All-Around InAsP/InP Quantum Discs-in-Nanowire Array Phototransistors with a High Gain-Bandwidth Product
Jeddi, Hossein ^LU ; Witzigmann, Bernd ; Adham, Kristi ^LU ; Hrachowina, Lukas ^LU ; Borgström, Magnus T. ^LU and Pettersson, Håkan ^LU (2023) In ACS Photonics 10(6). p.1748-1755
- Contribution to journal › Article
2016
Mark Lateral InAs/Si p-Type Tunnel FETs Integrated on Si - Part 2 : Simulation Study of the Impact of Interface Traps
Sant, Saurabh ; Moselund, Kirsten E. ; Cutaia, Davide ; Schmid, Heinz ; Borg, Mattias ^LU ; Riel, Heike and Schenk, Andreas (2016) In IEEE Transactions on Electron Devices 63(11). p.4240-4247
- Contribution to journal › Article
Mark Electrical Characterization of III-V Nanostructure
Shiri Babadi, Aein ^LU (2016)
- Thesis › Doctoral thesis (compilation)
2013
Mark A High-Frequency Transconductance Method for Characterization of High-k Border Traps in III-V MOSFETs
Johansson, Sofia ^LU ; Berg, Martin ^LU ; Persson, Karl-Magnus ^LU and Lind, Erik ^LU (2013) In IEEE Transactions on Electron Devices 60(2). p.776-781
- Contribution to journal › Article

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