Rainer Timm
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- 2014
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Mark
Electronic and Structural Differences between Wurtzite and Zinc Blende InAs Nanowire Surfaces: Experiment and Theory
- Contribution to journal › Article
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Mark
High resolution scanning gate microscopy measurements on InAs/GaSb nanowire Esaki diode devices
- Contribution to journal › Article
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Mark
Real-time studies of the atomic layer deposition of metal oxides using Ambient pressure x-ray photoelectron spectroscopy
(2014) APS March Meeting, 2014
- Contribution to conference › Abstract
- 2013
-
Mark
Interface characterization of metal-HfO2-InAs gate stacks using hard x-ray photoemission spectroscopy
- Contribution to journal › Article
-
Mark
Current−Voltage Characterization of Individual As-Grown Nanowires Using a Scanning Tunneling Microscope
- Contribution to journal › Article
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Mark
Epitaxial growth and surface studies of the Half Heusler compound NiTiSn (001)
- Contribution to journal › Article
-
Mark
Direct Imaging of Atomic Scale Structure and Electronic Properties of GaAs Wurtzite and Zinc Blende Nanowire Surfaces.
- Contribution to journal › Article
- 2012
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Mark
Surface Chemistry, Structure, and Electronic Properties from Microns to the Atomic Scale of Axially Doped Semiconductor Nanowires.
(2012) In ACS Nano
- Contribution to journal › Article
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Mark
Al2O3/InAs metal-oxide-semiconductor capacitors on (100) and (111)B substrates
- Contribution to journal › Article
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Mark
Atomic Surface Structure and Electronic Properties of Semiconductor Nanowires Studied by Scanning Tunneling Microscopy and Spectroscopy
(2012) ICPS 2012
- Contribution to conference › Abstract
