Stefan Andric (Former)

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2022
Mark Lateral III-V Nanowire MOSFETs in Low-Noise Amplifier Stages
Andric, Stefan ^LU ; Lindelow, Fredrik ^LU ; Fhager, Lars Ohlsson ^LU ; Lind, Erik ^LU and Wernersson, Lars Erik ^LU (2022) In IEEE Transactions on Microwave Theory and Techniques 70(2). p.1284-1291
- Contribution to journal › Article
Mark Performance, Analysis, and Modeling of III-V Vertical Nanowire MOSFETs on Si at Higher Voltages
Andric, Stefan ^LU ; Kilpi, Olli-Pekka ^LU ; Mamidala, Saketh, Ram ^LU ; Svensson, Johannes ^LU ; Lind, Erik ^LU and Wernersson, Lars-Erik ^LU (2022) In IEEE Transactions on Electron Devices 69(6). p.3055-3055
- Contribution to journal › Article
2021
Mark III-V Nanowire MOSFET High-Frequency Technology Platform
Andric, Stefan ^LU (2021)
- Thesis › Doctoral thesis (compilation)
Mark Millimeter-Wave Vertical III-V Nanowire MOSFET Device-To-Circuit Co-Design
Andric, Stefan ^LU ; Ohlsson Fhager, Lars ^LU and Wernersson, Lars Erik ^LU (2021) In IEEE Transactions on Nanotechnology 20. p.434-440
- Contribution to journal › Article
Mark Design of III-V Vertical Nanowire MOSFETs for Near-Unilateral Millimeter-Wave Operation
Andric, Stefan ^LU ; Ohlsson-Fhager, Lars ^LU and Wernersson, Lars Erik ^LU (2021) 15th European Microwave Integrated Circuits Conference, EuMIC 2020 In EuMIC 2020 - 2020 15th European Microwave Integrated Circuits Conference p.85-88
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Increased Breakdown Voltage in Vertical Heterostructure III-V Nanowire MOSFETs with a Field Plate
Kilpi, Olli Pekka ^LU ; Andric, Stefan ^LU ; Svensson, Johannes ^LU ; Ram, Mamidala Saketh ^LU ; Lind, Erik ^LU and Wernersson, Lars Erik ^LU (2021) In IEEE Electron Device Letters 42(11). p.1596-1598
- Contribution to journal › Article
2019
Mark Low-temperature back-end-of-line technology compatible with III-V nanowire MOSFETs
Andric, Stefan ^LU ; Ohlsson Fhager, Lars ^LU ; Lindelöw, Fredrik ^LU ; Kilpi, Olli Pekka ^LU and Wernersson, Lars Erik ^LU (2019) In Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics 37(6).
- Contribution to journal › Article
Mark Low-Temperature Front-Side BEOL Technology with Circuit Level Multiline Thru-Reflect-Line Kit for III-V MOSFETs on Silicon
Andric, Stefan ^LU ; Ohlsson, Lars ^LU and Wenrersson, Lars Erik ^LU (2019) 92nd ARFTG Microwave Measurement Conference, ARFTG 2019
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding