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High Current Density InAsSb/GaSb Tunnel Field Effect Transistors

Dey, Anil LU ; Borg, Mattias LU orcid ; Ganjipour, Bahram LU ; Ek, Martin LU orcid ; Dick Thelander, Kimberly LU ; Lind, Erik LU ; Nilsson, Peter LU ; Thelander, Claes LU and Wernersson, Lars-Erik LU (2012) 70th Annual Device Research Conference (DRC) p.205-206
Abstract
Steep-slope devices, such as tunnel field-effect transistors (TFETs), have recently gained interest

due to their potential for low power operation at room temperature. The devices are based on inter-band

tunneling which could limit the on-current since the charge carriers must tunnel through a barrier to traverse

the device. The InAs/GaSb heterostructure forms a broken type II band alignment which enables inter-band

tunneling without a barrier, allowing high on-currents. We have recently demonstrated high current density

(Ion,reverse = 17.5 mA/µm) nanowire Esaki diodes and in this work we investigate the potential of InAs/GaSb

heterostructure nanowires to operate as TFETs. We... (More)
Steep-slope devices, such as tunnel field-effect transistors (TFETs), have recently gained interest

due to their potential for low power operation at room temperature. The devices are based on inter-band

tunneling which could limit the on-current since the charge carriers must tunnel through a barrier to traverse

the device. The InAs/GaSb heterostructure forms a broken type II band alignment which enables inter-band

tunneling without a barrier, allowing high on-currents. We have recently demonstrated high current density

(Ion,reverse = 17.5 mA/µm) nanowire Esaki diodes and in this work we investigate the potential of InAs/GaSb

heterostructure nanowires to operate as TFETs. We present device characterization of InAs 0.85 Sb 0.15 /GaSb

nanowire TFETs, which exhibit record-high on-current levels. (Less)
Please use this url to cite or link to this publication:
author
; ; ; ; ; ; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
Tunneling Field-Effect Transistors, Broken gap, InAs, GaSb
host publication
Device research conference
pages
205 - 206
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
conference name
70th Annual Device Research Conference (DRC)
conference dates
2012-06-18
external identifiers
  • scopus:84866914447
ISSN
1548-3770
DOI
10.1109/DRC.2012.6257038
language
English
LU publication?
yes
additional info
The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Solid State Physics (011013006), Electrical and information technology (011041010), Polymer and Materials Chemistry (LTH) (011001041)
id
9742efbb-f9c0-4784-b3e8-1a90d4d8cf75 (old id 3127465)
date added to LUP
2016-04-01 13:20:58
date last changed
2023-09-02 22:23:09
@inproceedings{9742efbb-f9c0-4784-b3e8-1a90d4d8cf75,
  abstract     = {{Steep-slope devices, such as tunnel field-effect transistors (TFETs), have recently gained interest <br/><br>
due to their potential for low power operation at room temperature. The devices are based on inter-band <br/><br>
tunneling which could limit the on-current since the charge carriers must tunnel through a barrier to traverse <br/><br>
the device. The InAs/GaSb heterostructure forms a broken type II band alignment which enables inter-band <br/><br>
tunneling without a barrier, allowing high on-currents. We have recently demonstrated high current density <br/><br>
(Ion,reverse = 17.5 mA/µm) nanowire Esaki diodes and in this work we investigate the potential of InAs/GaSb <br/><br>
heterostructure nanowires to operate as TFETs. We present device characterization of InAs 0.85 Sb 0.15 /GaSb <br/><br>
nanowire TFETs, which exhibit record-high on-current levels.}},
  author       = {{Dey, Anil and Borg, Mattias and Ganjipour, Bahram and Ek, Martin and Dick Thelander, Kimberly and Lind, Erik and Nilsson, Peter and Thelander, Claes and Wernersson, Lars-Erik}},
  booktitle    = {{Device research conference}},
  issn         = {{1548-3770}},
  keywords     = {{Tunneling Field-Effect Transistors; Broken gap; InAs; GaSb}},
  language     = {{eng}},
  pages        = {{205--206}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  title        = {{High Current Density InAsSb/GaSb Tunnel Field Effect Transistors}},
  url          = {{https://lup.lub.lu.se/search/files/3313739/3128556.pdf}},
  doi          = {{10.1109/DRC.2012.6257038}},
  year         = {{2012}},
}