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- 2023
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Mark
Self-Heating in Gate-All-Around Vertical III-V InAs/InGaAs MOSFETs
(
- Contribution to journal › Article
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Mark
gm/Id Analysis of vertical nanowire III–V TFETs
(
- Contribution to journal › Letter
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Mark
Dynamics of Polarization Switching in Mixed Phase Ferroelectric-Antiferroelectric HZO Thin Films
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- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Effects of Interface Oxidation on Noise Properties and Performance in III–V Vertical Nanowire Memristors
(
- Contribution to journal › Article
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Mark
High-k/InGaAs interface defects at cryogenic temperature
(
- Contribution to journal › Article