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- 2024
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Mark
Determination of the conduction and valence band offsets at the Co3O4/3C-SiC p-n heterojunction
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- Contribution to journal › Article
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Mark
Detection of Very Fast Interface Traps at 4H-SiC/AlN and 4H-SiC/Al2O3 Interfaces
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- Chapter in Book/Report/Conference proceeding › Book chapter
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Mark
Characterization of Drain-Induced Barrier Lowering in GaN HEMTs Using a Drain Current Injection Technique
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- Contribution to journal › Article
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Mark
Impact of Al profile in high-Al content AlGaN/GaN HEMTs on the 2DEG properties
(
- Contribution to journal › Article
- 2023
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Mark
Low Al-content n-type AlxGa1−xN layers with a high-electron-mobility grown by hot-wall metalorganic chemical vapor deposition
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- Contribution to journal › Article
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Mark
Observations of very fast electron traps at SiC/high-κ dielectric interfaces
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- Contribution to journal › Article
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Mark
Room temperature two-dimensional electron gas scattering time, effective mass, and mobility parameters in AlxGa1−xN/GaN heterostructures (0.07 ≤ x ≤ 0.42)
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- Contribution to journal › Article
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Mark
Correlating cathodoluminescence and scanning transmission electron microscopy for InGaN platelet nano-LEDs
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- Contribution to journal › Article
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Mark
Tuning composition in graded AlGaN channel HEMTs toward improved linearity for low-noise radio-frequency amplifiers
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- Contribution to journal › Article
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Mark
High-quality N-polar GaN optimization by multi-step temperature growth process
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- Contribution to journal › Article