Vanya Darakchieva
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- 2025
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Mark
Simulating Scaling Effects in Fully Vertical GaN FinFETs
- Contribution to journal › Article
- 2024
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Mark
Characterization of semiconductors by spectroscopic ellipsometry
- Chapter in Book/Report/Conference proceeding › Book chapter
-
Mark
COMPREHENSIVE SEMICONDUCTOR SCIENCE AND TECHNOLOGY, SECOND EDITION : Volumes 1-3
(2024) 1-3.
- Book/Report › Book
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Mark
PREFACE TO VOLUME 2
- Chapter in Book/Report/Conference proceeding › Foreword/Postscript
-
Mark
Detection of Very Fast Interface Traps at 4H-SiC/AlN and 4H-SiC/Al2O3 Interfaces
- Chapter in Book/Report/Conference proceeding › Book chapter
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Mark
Impact of Al profile in high-Al content AlGaN/GaN HEMTs on the 2DEG properties
- Contribution to journal › Article
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Mark
Characterization of Drain-Induced Barrier Lowering in GaN HEMTs Using a Drain Current Injection Technique
- Contribution to journal › Article
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Mark
Electronic Properties of Group-III Nitride Semiconductors and Device Structures Probed by THz Optical Hall Effect
- Contribution to journal › Article
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Mark
Effective uniaxial dielectric function tensor and optical phonons in (2 ¯ 01)-oriented β - Ga2 O3 films with equally distributed sixfold-rotation domains
- Contribution to journal › Article
-
Mark
Determination of the conduction and valence band offsets at the Co3O4/3C-SiC p-n heterojunction
- Contribution to journal › Article
