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2024
Mark Characterization of Trapping Effects Related to Carbon Doping Level in AlGaN Back-Barriers for AlGaN/GaN HEMTs
Castillo, Ragnar Ferrand Drake Del ; Chen, Ding Yuan ; Chen, Jr Tai ; Thorsell, Mattias ; Darakchieva, Vanya ^LU and Rorsman, Niklas (2024) In IEEE Transactions on Electron Devices 71(6). p.3596-3602
- Contribution to journal › Article
Mark Characterization of Drain-Induced Barrier Lowering in GaN HEMTs Using a Drain Current Injection Technique
Hult, Björn ; Bergsten, Johan ; Ferrand-Drake Del Castillo, Ragnar ; Darakchieva, Vanya ^LU ; Malmros, Anna ; Hjelmgren, Hans ; Thorsell, Mattias and Rorsman, Niklas (2024) In IEEE Transactions on Electron Devices 71(12). p.7383-7389
- Contribution to journal › Article
Mark Cryogenic Evaluation of Resistive Random Access Memory With Enhanced Endurance at 14 K
Mamidala, Saketh Ram ^LU ; Mamidala, Karthik Ram ^LU and Wernersson, Lars-Erik ^LU (2024) In IEEE Transactions on Electron Devices
- Contribution to journal › Article
2023
Mark Impact of Temperature-Induced Oxide Defects on Hf_xZr_1−xO₂ Ferroelectric Tunnel Junction Memristor Performance
Athle, Robin ^LU and Borg, Mattias ^LU (2023) In IEEE Transactions on Electron Devices 70(3). p.1412-1416
- Contribution to journal › Article
Mark Cryogenic Characteristics of InGaAs MOSFET
Sodergren, L. ^LU ; Olausson, P. ^LU and Lind, E. ^LU (2023) In IEEE Transactions on Electron Devices 70(3). p.1226-1230
- Contribution to journal › Article
Mark Geometrical Magnetoresistance as a Tool for Carrier Mobility Extraction in InGaAs MOSFETs
Olausson, Patrik ^LU and Lind, Erik ^LU (2023) In IEEE Transactions on Electron Devices 70(11). p.5614-5618
- Contribution to journal › Article
Mark Capacitance and Mobility Evaluation for Normally-Off Fully-Vertical GaN FinFETs
Gribisch, Philipp ^LU ; Carrascon, Rosalia Delgado ; Darakchieva, Vanya ^LU and Lind, Erik ^LU (2023) In IEEE Transactions on Electron Devices 70(8). p.4101-4107
- Contribution to journal › Article
Mark Tuning of Quasi-Vertical GaN FinFETs Fabricated on SiC Substrates
Gribisch, Philipp ^LU ; Carrascon, Rosalia Delgado ; Darakchieva, Vanya ^LU and Lind, Erik ^LU (2023) In IEEE Transactions on Electron Devices 70(5). p.2408-2414
- Contribution to journal › Article
2022
Mark Performance, Analysis, and Modeling of III-V Vertical Nanowire MOSFETs on Si at Higher Voltages
Andric, Stefan ^LU ; Kilpi, Olli-Pekka ^LU ; Mamidala, Saketh, Ram ^LU ; Svensson, Johannes ^LU ; Lind, Erik ^LU and Wernersson, Lars-Erik ^LU (2022) In IEEE Transactions on Electron Devices 69(6). p.3055-3055
- Contribution to journal › Article
2021
Mark Capacitance Scaling in In_0.71Ga_0.29As/InP MOSFETs with Self-Aligned a:Si Spacers
Garigapati, Navya S. ^LU ; Lindelow, Fredrik ^LU ; Sodergren, Lasse ^LU and Lind, Erik ^LU (2021) In IEEE Transactions on Electron Devices 68(8). p.3762-3767
- Contribution to journal › Article

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