Competence centers, LTH

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2025
Mark Impact of Layout on the RF Performance of Vertical In–Ga–As Nanowire MOSFETs
Sandberg, Marcus E. ^LU ; Löfstrand, Anette ^LU ; Svensson, Johannes ^LU and Fhager, Lars ^LU (2025) In IEEE Microwave and Wireless Technology Letters 35(9). p.1392-1395
- Contribution to journal › Article
Mark Trust calibration in IDEs : paving the way for widespread adoption of AI refactoring
Borg, Markus ^LU (2025) p.37-41
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark QUPER-MAn : benchmark-guided target setting for maintainability requirements
Borg, Markus ^LU ; Larsson, Martin ; Breid, Philip and Hagatulah, Nadim ^LU (2025) p.29-36
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark ACE : automated technical debt remediation with validated large language model refactorings
Tornhill, Adam ; Borg, Markus ^LU ; Hagatulah, Nadim ^LU and Söderberg, Emma ^LU (2025) p.1318-1324
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Excel isn’t a process, and not all ‘intelligence’ is smart
Tahvili, Sahar and Borg, Markus ^LU (2025) In IEEE Software 42(4). p.11-14
- Contribution to journal › Article
Mark Responsible requirements engineering in a VUCA world
Borg, Markus ^LU ; Beck, Martina ; Beck, Andreas ; Jiménez, Simon ; Kanellopoulos, Yiannis and Penzenstadler, Birgit (2025) In IEEE Software 42(5). p.16-20
- Contribution to journal › Article
Mark Industrial code quality benchmarks : toward gamification of software maintainability
Borg, Markus ^LU ; Udayakumar, Amogha and Tornhill, Adam (2025)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Robustness and Privacy Interplay in Patient Membership Inference
Baninajjar, Anahita ^LU ; Aminifar, Amin ; Hosseini, Kamran ; Aminifar, Amir ^LU and Rezine, Ahmed (2025)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Formal Local Implication Between Two Neural Networks
Baninajjar, Anahita ^LU ; Rezine, Ahmed and Aminifar, Amir ^LU (2025)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Scalable Vertical In-Ga-As Nanowire MOSFET With 67 mV/dec at 126μm Gate Width
Lofstrand, Anette ^LU ; Sandberg, Marcus E. ^LU ; Svensson, Johannes ^LU and Fhager, Lars ^LU (2025) In IEEE Electron Device Letters 46(4). p.560-563
- Contribution to journal › Article

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