Vanya Darakchieva
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- 2024
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PREFACE TO VOLUME 2
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- Chapter in Book/Report/Conference proceeding › Foreword/Postscript
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Characterization of Drain-Induced Barrier Lowering in GaN HEMTs Using a Drain Current Injection Technique
(
- Contribution to journal › Article
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COMPREHENSIVE SEMICONDUCTOR SCIENCE AND TECHNOLOGY, SECOND EDITION : Volumes 1-3
2024) 1-3.(
- Book/Report › Book
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Mark
Characterization of semiconductors by spectroscopic ellipsometry
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- Chapter in Book/Report/Conference proceeding › Book chapter
- 2023
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Mark
Structural investigation of ultra-low resistance deeply recessed sidewall ohmic contacts for AlGaN/GaN HEMTs based on Ti/Al/Ti-metallization
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- Contribution to journal › Article
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On the thermal conductivity anisotropy in wurtzite GaN
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- Contribution to journal › Article
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THz Spectroscopic Electron Paramagnetic Resonance of the Fe3+Defect in GaN
2023) 48th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2023 In International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Correlating cathodoluminescence and scanning transmission electron microscopy for InGaN platelet nano-LEDs
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- Contribution to journal › Article
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Mark
Capacitance and Mobility Evaluation for Normally-Off Fully-Vertical GaN FinFETs
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- Contribution to journal › Article
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Mark
Observations of very fast electron traps at SiC/high-κ dielectric interfaces
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- Contribution to journal › Article