1 – 12 of 12
- show: 20
- |
- sort: year (new to old)
Close
Embed this list
<iframe src=" "
width=" "
height=" "
allowtransparency="true"
frameborder="0">
</iframe>
- 2022
-
Mark
Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples
(
- Contribution to journal › Article
- 2021
-
Mark
Multi-slice ptychography enables high-resolution measurements in extended chemical reactors
(
- Contribution to journal › Article
-
Mark
Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view
(
- Contribution to journal › Article
-
Mark
Flexible ptychography platform to expand the potential of imaging at free electron lasers
(
- Contribution to journal › Article
-
Mark
Planar refractive lenses made of SiC for high intensity nanofocusing
(
- Contribution to journal › Article
- 2020
-
Mark
PtyNAMi : Ptychographic nano-analytical microscope
(
- Contribution to journal › Article
- 2019
-
Mark
Refractive hard x-ray vortex phase plates
(
- Contribution to journal › Article
-
Mark
Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III : Signal-to-background optimization for imaging with high sensitivity
2019) X-Ray Nanoimaging: Instruments and Methods IV 2019 In Proceedings of SPIE - The International Society for Optical Engineering 11112.(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
A versatile nanoreactor for complementary in situ X-ray and electron microscopy studies in catalysis and materials science
(
- Contribution to journal › Article
- 2018
-
Mark
Nanofocusing with aberration-corrected rotationally parabolic refractive X-ray lenses
(
- Contribution to journal › Article
- 2017
-
Mark
PtyNAMi : Ptychographic nano-analytical microscope at PETRA III - Interferometrically tracking positions for 3D x-ray scanning microscopy using a ball-lens retroreflector
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2016
-
Mark
Quantitative characterization of aberrations in x-ray optics
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding