Martin Hjort
31 – 40 of 43
- show: 10
- |
- sort: year (new to old)
Close
Embed this list
<iframe src=""
width=""
height=""
allowtransparency="true"
frameborder="0">
</iframe>
- 2013
-
Mark
Direct Imaging of Atomic Scale Structure and Electronic Properties of GaAs Wurtzite and Zinc Blende Nanowire Surfaces.
- Contribution to journal › Article
-
Mark
Epitaxial growth and surface studies of the Half Heusler compound NiTiSn (001)
- Contribution to journal › Article
- 2012
-
Mark
Surface Chemistry, Structure, and Electronic Properties from Microns to the Atomic Scale of Axially Doped Semiconductor Nanowires.
(2012) In ACS Nano
- Contribution to journal › Article
-
Mark
Al2O3/InAs metal-oxide-semiconductor capacitors on (100) and (111)B substrates
- Contribution to journal › Article
-
Mark
Characterizing the geometry of InAs nanowires using mirror electron microscopy
- Contribution to journal › Article
-
Mark
Atomic Surface Structure and Electronic Properties of Semiconductor Nanowires Studied by Scanning Tunneling Microscopy and Spectroscopy
(2012) ICPS 2012
- Contribution to conference › Abstract
-
Mark
Polytypic InAs Nanowire Studies Using Scanning Tunneling Microscopy
(2012) MRS Fall Meeting, 2012
- Contribution to conference › Abstract
- 2011
-
Mark
Doping profile of InP nanowires directly imaged by photoemission electron microscopy
- Contribution to journal › Article
-
Mark
Interface composition of InAs nanowires with Al2O2 and HfO2 thin films
- Contribution to journal › Article
-
Mark
Interface composition of atomic layer deposited HfO2 and Al2O3 thin films on InAs studied by X-ray photoemission spectroscopy
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
