Lars-Erik Wernersson

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2024
Mark A Reconfigurable Ferroelectric Transistor as An Ultra-Scaled Cell for Low-Power In-Memory Data Processing
Zhu, Zhongyunshen ^LU ; Persson, Anton E.O. ^LU and Wernersson, Lars Erik ^LU (2024) In Advanced Electronic Materials
- Contribution to journal › Article
Mark Cryogenic Ferroelectricity of HZO Capacitors on a III-V Semiconductor
Ram, Mamidala Karthik ^LU ; Dahlberg, Hannes ^LU and Wernersson, Lars Erik ^LU (2024) In IEEE Electron Device Letters 45(10). p.1827-1830
- Contribution to journal › Article
Mark TFET Circuit Configurations Operating below 60 mV/dec
Rangasamy, Gautham ^LU ; Zhu, Zhongyunshen ^LU ; Fhager, Lars Ohlsson ^LU and Wernersson, Lars Erik ^LU (2024) In IEEE Transactions on Nanotechnology 23. p.441-447
- Contribution to journal › Article
Mark Source Design of Vertical III-V Nanowire Tunnel Field-Effect Transistors
Rangasamy, Gautham ^LU ; Zhu, Zhongyunshen ^LU and Wernersson, Lars-Erik ^LU (2024) In IEEE Journal on Exploratory Solid-State Computational Devices and Circuits 10. p.8-12
- Contribution to journal › Article
2023
Mark Reconfigurable signal modulation in a ferroelectric tunnel field-effect transistor
Zhu, Zhongyunshen ^LU ; Persson, Anton E. O. ^LU and Wernersson, Lars-Erik ^LU (2023) In Nature Communications 14.
- Contribution to journal › Article
Mark Low-Power, Self-Aligned Vertical InGaAsSb NW PMOS With S < 100 mV/dec
Krishnaraja, Abinaya ^LU ; Zhu, Zhongyunshen ^LU ; Svensson, Johannes ^LU and Wernersson, Lars Erik ^LU (2023) In IEEE Electron Device Letters 44(7). p.1064-1067
- Contribution to journal › Article
Mark Effects of Interface Oxidation on Noise Properties and Performance in III–V Vertical Nanowire Memristors
Mamidala, Saketh Ram ^LU ; Svensson, Johannes ^LU and Wernersson, Lars-Erik ^LU (2023) In ACS Applied Materials and Interfaces 15(15).
- Contribution to journal › Article
Mark Electrically active defects in Al₂O₃-InGaAs MOS stacks at cryogenic temperatures
La Torraca, Paolo ; Padovani, Andrea ; Wernersson, Lars Erik ^LU ; Cherkaoui, Karim ^LU ; Hurley, Paul and Larcher, Luca (2023) 2023 IEEE International Integrated Reliability Workshop, IIRW 2023 In IEEE International Integrated Reliability Workshop Final Report
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark High-k/InGaAs interface defects at cryogenic temperature
Cherkaoui, K. ^LU ; La Torraca, P. ; Lin, J. ; Maraviglia, N. ; Andersen, A. ^LU ; Wernersson, L. E. ^LU ; Padovani, A. ; Larcher, L. and Hurley, P. K. (2023) In Solid-State Electronics 207.
- Contribution to journal › Article
Mark High Current Density Vertical Nanowire TFETs With I₆₀ > 1 μ A/ μ m
Rangasamy, Gautham ^LU ; Zhu, Zhongyunshen ^LU and Wernersson, Lars-erik ^LU (2023) In IEEE Access 11. p.95692-95696
- Contribution to journal › Article

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